000 00309nam a2200109Ia 4500
008 230411s9999 xx 000 0 und d
082 _a004.165
_bKAP
100 _a Lall (Pradeep)
245 0 _aInfluence of temerature on microelectronics and system reliability
260 _b BocaRatan
_aCRC Press
942 _cBK
999 _c2641
_d2641