Influence of temerature on microelectronics and system reliability

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TextPublication details: BocaRatan CRC PressDDC classification:

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Holdings
Item type	Current library	Call number	Status	Notes	Date due	Barcode
Books	BVCOE Library Reference	004.165 KAP (Browse shelf(Opens below))	Available	Ref. 3 B		EB7010

Previous	No cover image available No cover image available	No cover image available No cover image available	No cover image available No cover image available	No cover image available No cover image available	No cover image available No cover image available	No cover image available No cover image available	No cover image available No cover image available	Next
Previous	004.016 HOL- E Experimental Methods For Engineers	004.15 MAT Discrete Mathematics with application	004.151 LAN Computational Portial Differential Equations	004.165 KAP Influence of temerature on microelectronics and system reliability	004.165 UFF The 80 x 86 Family Design, Programming and Interfacing	004.21 DEN Systems Analysis and Design : An ObjectOriented Approach with UML	004.21 HUG Mastering System Analysis and Design	Next

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